James Fujimoto

James G. Fujimoto is Elihu Thomson Professor of Electrical Engineering and Computer Science at the Massachusetts Institute of Technology (MIT) and a visiting professor of ophthalmology at Tufts University School of Medicine, Boston, Massachusetts.

James G. Fujimoto
NationalityJapanese-American
Alma materMassachusetts Institute of Technology
Known foroptical coherence tomography;
AwardsRank Prize in Optoelectronics (2001)
Zeiss Research Award (2011)
Champalimaud Vision Award (2012)
Frederic Ives Medal (2015)
Russ Prize (2017)
Scientific career
FieldsApplied physics
InstitutionsMassachusetts Institute of Technology

He received his M.Sc. and Ph.D. from MIT in 1981 and 1984 respectively. He has been part of the MIT faculty since 1985 and is currently Elihu Thomson Professor of Electrical Engineering and Computer Science at MIT and Adjunct Professor of Ophthalmology at Tufts University School of Medicine. He is known for his leading role in the invention of a novel medical imaging modality named optical coherence tomography[1] that is now a standard of care for diagnosis and treatment of several diseases with widespread adoption in ophthalmology.[2]

Professor Fujimoto is a fellow of the American Physical Society, the National Academy of Science, the National Academy of Engineering, and the American Association for the Advancement of Science. He has published over 400 journal articles.

Awards & Honors

References
  1. Huang D, Swanson EA, Lin CP, Schuman JS, Stinson WG, Chang W, Hee MR, Flotte T, Gregory K, Puliafito CA, Fujimoto JG (1991). "Optical Coherence Tomography". Science. 254 (5035): 1178–1181. doi:10.1126/science.1957169. PMC 4638169. PMID 1957169.
  2. Boyd, Kierstan (14 October 2015). "What Is Optical Coherence Tomography?". American Academy of Ophthalmology. Retrieved 8 September 2016.
  3. "APS Fellow Archive". APS. Retrieved 18 September 2020.
  4. "2012 António Champalimaud Vision Award". Champalimaud Foundation. 2012. Retrieved 8 September 2016.
  5. "BioMedical Optics Award - SPIE". spie.org. Retrieved 2020-09-01.
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