X-Ray Spectrometry (journal)

X-Ray Spectrometry is a bimonthly peer-reviewed scientific journal established in 1972 and published by John Wiley & Sons. It covers the theory and application of X-ray spectrometry. The current editor-in-chief is R. Van Grieken (University of Antwerp).

X-Ray Spectrometry
DisciplineX-ray spectrometry
LanguageEnglish
Edited byR. Van Grieken
Publication details
History1972-present
Publisher
FrequencyBimonthly
1.445 (2011)
Standard abbreviations
ISO 4X-Ray Spectrom.
Indexing
CODENXRSPAX
ISSN0049-8246 (print)
1097-4539 (web)
LCCN72627130
OCLC no.474795286
Links

Abstracting and indexing

The journal is abstracted and indexed in:

According to the Journal Citation Reports, the journal has a 2011 impact factor of 1.445, ranking it 25th out of 42 journals in the category "Spectroscopy".[1]

Notable articles

The highest-cited articles from this journal are:

  1. Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; Van Espen, P. (1994). "Analysis of X-ray spectra by iterative least squares (AXIL): New developments". X-Ray Spectrometry. 23 (6): 278. doi:10.1002/xrs.1300230609.
  2. Packwood, R. H.; Brown, J. D. (1981). "A Gaussian expression to describe φ(ρz) curves for quantitative electron probe microanalysis". X-Ray Spectrometry. 10 (3): 138. doi:10.1002/xrs.1300100311.
  3. Norrish, K.; Hutton, J. T. (1977). "Plant analyses by X-ray spectrometry I—Low atomic number elements, sodium to calcium". X-Ray Spectrometry. 6: 6–11. doi:10.1002/xrs.1300060104.

References

  1. "Journals Ranked by Impact: Spectroscopy". 2011 Journal Citation Reports. Web of Science (Science ed.). Thomson Reuters. 2013.
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